X-Ray Fluorescence Thickness and Composition Measurement Tools
Source: Veeco Industrial Measurement
The System XR uses an X-ray fluorescence (XRF), which is a non-contact, non-destructive metrology technique suitable to thin-film measurement in the metal finishing industry...
The System XR uses an X-ray fluorescence (XRF), which is a non-contact, non-destructive metrology technique suitable to thin-film measurement in the metal finishing industry. This measurement device measures the thickness and composition of up to three layers of deposited metals simultaneously, from angstrom to micron thickness ranges. The system can also determine binary and ternary alloy thickness and composition.
The device's focusing element delivers a 50-micron beam for accurate measurement. In addition, it offers zoom optics for reproducibility on smaller areas. Constant calibration allows finishers to measure samples instantly without calibration standards, and the automatic application recognition feature identifies the surface to be measured.
Veeco Industrial Measurement, 105 Comac St., Ronkonkoma, NY 11779. Tel: 516-738-9300; Fax: 516-738-9329.
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